Field Emission Scanning Electron Microscope (FESEM)

Nimi ja malli: Zeiss ULTRA plus

Yhteyshenkilö: N/A

Valmistusvuosi: 2008

Asennusvuosi: 2008

Laitteen yleiskuvaus: Field emission scanning electron microscope (FESEM) enables high resolution electron imaging with low acceleration voltages which makes it possible to analyze also delicate biological samples and nanostructures.

Käyttö: High-resolution electron microscope imaging and elemental and structural analysis of materials. Also biological samples can be studied

Tärkeimmät ominaisuudet ja lisävarusteet: Microscope is equipped with STEM (Scanning Transmission Electron Microscope) detector, so it can also be used in transmission electron microscope imaging of thin samples. For chemical and structural analysis microscope is equipped with EDS (Energy-Dispersive X-ray Spectroscopy) analyzer and EBSD (Electro Backscatter Diffraction) camera.

Tärkeimmät spesifikaatiot: Acceleration voltage: 0.02-30 kV
Resolution: 1.0 nm/15 kV, 1.7 nm/ 1 kV, 4.0 nm/0.1 kV
Detectors: two SE, two BSE, one STEM
EDS detector
Elemental analysis from carbon to uranium
EBSD camera and analysis software for crystal structure analysis
Flood gun for charge compensation

Valokuva:

Sijainti: University of Oulu, Center of Microscopy and Nanotechnology

Kaupunki: Oulu