Surface profiler

Organisaatiot: Itä-Suomen yliopisto » Fysiikan ja matematiikan laitos (Joensuu)

Veeco Dektak 150+

Pertti Pääkkönen

2009

2009

Sufrace profiler with stylus.

  • Film thickness measurement

  • Available stylii: 12.5 µm, 2.5µm
  • Motorized XY stage 152 mm x 152 mm
  • Step standard 4.454 µm 0.058 µm

  • Horizontal scan range: 55 mm
  • Vertical range: 1 mm
  • Repeatability: 0.4 nm @ 0.1 µm step, 1 nm @ 1 µm step

University of Joensuu, Department of Physics and Mathematics

Joensuu

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