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Other Optical Characterization

  • 1. Nanofabrication
  • 2. Characterization
  • 2.9. Optical Characterization
  • 2.9.1. Scanning Near-field Optical Microscopy (SNOM)
  • 2.9.2. Spectroscopic Ellipsometry (SE, VASE)
  • 2.9.3. Photoluminescence Spectroscopy (PL)
  • 2.9.4. Spectrophotometry
  • 2.9.5. Other Optical Characterization
    • Instruments
    Fizeau interferometer - MIKES Centre for Metrology
    Laser diffractometer - MIKES Centre for Metrology
    SPR - Surface Plasmon Resonance Sensor - Tampere University of Technology
    UV/Vis/NIR spectrometer (Perkin Elmer Lambda 950) - Aalto University School of Science and Technology (TKK)

    Expertise
    Photophysics and photochemistry of nanostructures - Tampere University of Technology
    Quantitative microscopy - MIKES Centre for Metrology
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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