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Secondary Ion Mass Spectrometry (SIMS)

  • 1. Nanofabrication
  • 2. Characterization
  • 2.5. Chemical Structure Characterization
  • 2.5.1. Optical Spectroscopy (IR, FTIR, Raman)
  • 2.5.2. Secondary Ion Mass Spectrometry (SIMS)
    • Instruments
    MiniSIMS - University of Eastern Finland

    Expertise
    Thin film deposition and analysis - Lappeenranta University of Technology
  • 2.5.3. Scanning Near-field Optical Microscopy (SNOM)
  • 2.5.4. Nuclear Magnetic Resonance (NMR)
  • 2.5.5. Electron Spectroscopy (XPS/ESCA, AES, SAM)
  • 2.5.6. X-ray Spectroscopy (XRF, NEXAFS/EXAFS)
  • 2.5.7. Crystal Structure Characterization (XRD, EBSD)
  • 2.5.8. Electron Energy Loss spectroscopy (EELS)
  • 2.5.9. Low Energy Electron Diffraction (LEED)
  • 2.5.10. Electron Paramagnetic Resonance (EPR)
  • 2.5.11. Other Chemical Structure Characterization
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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