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Profilometry

  • 1. Nanofabrication
  • 2. Characterization
  • 2.3. Film thickness measurement
  • 2.3.1. Ellipsometry
  • 2.3.2. Reflectometry
  • 2.3.3. Profilometry
    • Instruments
    Atomic Force Microscope - Savonia University of Applied Sciences
    Optical profiler - University of Joensuu
    Profilometer - Aalto University School of Science and Technology (TKK)
    Profilometer - University of Jyväskylä
    Stylus profilometer - University of Oulu

  • 2.3.4. Interferometry
  • 2.3.5. UV-vis Spectroscopy
  • 2.3.6. Other Film thickness measurement
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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