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Other Nanostructure analysis

  • 1. Nanofabrication
  • 2. Characterization
  • 2.2. Nanostructure analysis
  • 2.2.1. X-ray scattering (SAXS, WAXS)
  • 2.2.2. Electron Backscattered Diffraction (EBSD)
  • 2.2.3. Other Nanostructure analysis
    • Instruments
    Surface area and porosity analyzer - University of Eastern Finland
    X-ray Photoelectron Spectrometer (XPS) - Tampere University of Technology
    X-ray Single Crystal Diffractometer - University of Jyväskylä

    Expertise
    Porous silicon - University of Eastern Finland
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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