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» Capability Classification
Confocal Microscopy
1. Nanofabrication
2. Characterization
2.1. Imaging, Surface Profiling and Geometric Characterization
2.1.1. Scanning Electron Microscopy (SEM)
2.1.2. Transmission Electron Microscopy (TEM)
2.1.3. Scanning Tunneling Microscopy (STM)
2.1.4. Atomic Force Microscopy (AFM)
2.1.5. Focused Ion Beam (FIB)
2.1.6. X-ray Tomography
2.1.7. Confocal Microscopy
Instruments
Confocal microscope - University of Eastern Finland
Confocal Microscope - University of Jyväskylä
Confocal Microscope - University of Jyväskylä
Fluorescence Lifetime Microscope - Tampere University of Technology
Expertise
Photophysics and photochemistry of nanostructures - Tampere University of Technology
2.1.8. Surface Profilometry
2.1.9. Particle Size Analysis and Counting (PCS, DLS)
2.1.10. Other Imaging, Surface Profiling and Geometric Characterization
3. Computation, Modeling and Simulation
4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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