Suomeksi

FinDNano
Frontpage Info Capability Classification Research Institutes Companies Search Contact Links Images  

FinDNanoSearch FinDNano


Frontpage » Capability Classification

Image Analysis Software

  • 1. Nanofabrication
  • 2. Characterization
  • 3. Computation, Modeling and Simulation
  • 3.1. Software
  • 3.1.1. Image Analysis Software
    • Instruments
    Field emission scanning electron microscope (FEG-SEM) - Tampere University of Technology
    Scanning Tunneling Microscope (STM) - Tampere University of Technology

    Expertise
    LabVIEW programming for data acquisition and analyses - Savonia University of Applied Sciences
  • 3.1.2. Atomistic Modeling Softaware
  • 3.1.3. Mesoscopic Modeling Softaware
  • 3.1.4. Continuum Modeling Softaware
  • 3.1.5. Other Software
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
Login
Sitemap
Powered by Evianet Solutions Oy