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Opto-acoustic Spectroscopy

  • 1. Nanofabrication
  • 2. Characterization
  • 2.8. Electrical and Magnetic Characterization
  • 2.8.12. Other Electrical and Magnetic Characterization
  • 2.8.1. Capacitance Measurements
  • 2.8.2. Current-Voltage Measurements
  • 2.8.3. Surface Resistance Measurements
  • 2.8.4. ECV Doping Profiling (Polaron)
  • 2.8.5. Hall Measurements
  • 2.8.6. Electroluminescence Spectroscopy (EL)
  • 2.8.7. Magnetometry
  • 2.8.8. Impedance Spectroscopy
  • 2.8.9. Cathodoluminescence
  • 2.8.10. Opto-acoustic Spectroscopy
    • Instruments
    Mapping Controlled Atmosphere Kelvin-Probe System - Aalto University School of Science and Technology (TKK)

  • 2.8.11. Ultraviolet Photoelectron Spectroscopy (UPS)
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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