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Crystal Structure Characterization (XRD, EBSD)
1. Nanofabrication
2. Characterization
2.5. Chemical Structure Characterization
2.5.1. Optical Spectroscopy (IR, FTIR, Raman)
2.5.2. Secondary Ion Mass Spectrometry (SIMS)
2.5.3. Scanning Near-field Optical Microscopy (SNOM)
2.5.4. Nuclear Magnetic Resonance (NMR)
2.5.5. Electron Spectroscopy (XPS/ESCA, AES, SAM)
2.5.6. X-ray Spectroscopy (XRF, NEXAFS/EXAFS)
2.5.7. Crystal Structure Characterization (XRD, EBSD)
Instruments
Field Emission Scanning Electron Microscope (FESEM) - University of Oulu
Scanning Electron Microscope (SEM) - University of Oulu
X-ray diffractometer - University of Helsinki
X-ray diffractometer - University of Eastern Finland
X-ray diffractometer - University of Helsinki
X-Ray Diffractometer - Aalto University School of Science and Technology (TKK)
X-ray diffractometer - University of Eastern Finland
X-ray diffractometer - University of Eastern Finland
X-ray Diffractometer (XRD) - University of Oulu
Expertise
Thin Films and Other Nanostructured Materials - University of Helsinki
2.5.8. Electron Energy Loss spectroscopy (EELS)
2.5.9. Low Energy Electron Diffraction (LEED)
2.5.10. Electron Paramagnetic Resonance (EPR)
2.5.11. Other Chemical Structure Characterization
3. Computation, Modeling and Simulation
4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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