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Other Film thickness measurement

  • 1. Nanofabrication
  • 2. Characterization
  • 2.3. Film thickness measurement
  • 2.3.1. Ellipsometry
  • 2.3.2. Reflectometry
  • 2.3.3. Profilometry
  • 2.3.4. Interferometry
  • 2.3.5. UV-vis Spectroscopy
  • 2.3.6. Other Film thickness measurement
    • Instruments
    SPR - Surface Plasmon Resonance Sensor - Tampere University of Technology
    X-ray Photoelectron Spectrometer (XPS) - Tampere University of Technology

  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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