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Electron Backscattered Diffraction (EBSD)

  • 1. Nanofabrication
  • 2. Characterization
  • 2.2. Nanostructure analysis
  • 2.2.1. X-ray scattering (SAXS, WAXS)
  • 2.2.2. Electron Backscattered Diffraction (EBSD)
    • Instruments
    Field emission scanning electron microscope (FEG-SEM) - Tampere University of Technology
    Field Emission Scanning Electron Microscope (FESEM) - University of Oulu
    Scanning Electron Microscope (SEM) - University of Oulu
    Scanning electron microscope (SEM) - Tampere University of Technology

  • 2.2.3. Other Nanostructure analysis
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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