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Particle Size Analysis and Counting (PCS, DLS)

  • 1. Nanofabrication
  • 2. Characterization
  • 2.1. Imaging, Surface Profiling and Geometric Characterization
  • 2.1.1. Scanning Electron Microscopy (SEM)
  • 2.1.2. Transmission Electron Microscopy (TEM)
  • 2.1.3. Scanning Tunneling Microscopy (STM)
  • 2.1.4. Atomic Force Microscopy (AFM)
  • 2.1.5. Focused Ion Beam (FIB)
  • 2.1.6. X-ray Tomography
  • 2.1.7. Confocal Microscopy
  • 2.1.8. Surface Profilometry
  • 2.1.9. Particle Size Analysis and Counting (PCS, DLS)
    • Instruments
    Fast mobility particle sizer (FMPS) - University of Eastern Finland
    Nano range scanning mobility particle sizer (Nano-SMPS) - University of Eastern Finland
    Particle Size Analyzer - University of Jyväskylä
    Particle size analyzer - Teknologiakeskus KETEK Oy
    Particle Size Analyzer - University of Jyväskylä
    Particle size and zeta potential analyzer - University of Eastern Finland

    Expertise
    Porous silicon - University of Eastern Finland
  • 2.1.10. Other Imaging, Surface Profiling and Geometric Characterization
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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