Suomeksi

FinDNano
Frontpage Info Capability Classification Research Institutes Companies Search Contact Links Images  

FinDNanoSearch FinDNano


Frontpage » Capability Classification

Surface Profilometry

  • 1. Nanofabrication
  • 2. Characterization
  • 2.1. Imaging, Surface Profiling and Geometric Characterization
  • 2.1.1. Scanning Electron Microscopy (SEM)
  • 2.1.2. Transmission Electron Microscopy (TEM)
  • 2.1.3. Scanning Tunneling Microscopy (STM)
  • 2.1.4. Atomic Force Microscopy (AFM)
  • 2.1.5. Focused Ion Beam (FIB)
  • 2.1.6. X-ray Tomography
  • 2.1.7. Confocal Microscopy
  • 2.1.8. Surface Profilometry
    • Instruments
    Atomic Force Microscope - Savonia University of Applied Sciences
    Optical 3D profilometer - Mikpolis Oy
    Optical profiling system - Tampere University of Technology
    Stylus instrument - MIKES Centre for Metrology
    Surface profiler - University of Eastern Finland

    Expertise
    Nanoindentation - Savonia University of Applied Sciences
    Quantitative microscopy - MIKES Centre for Metrology
    Thin film deposition and analysis - Lappeenranta University of Technology
  • 2.1.9. Particle Size Analysis and Counting (PCS, DLS)
  • 2.1.10. Other Imaging, Surface Profiling and Geometric Characterization
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
Login
Sitemap
Powered by Evianet Solutions Oy