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Transmission Electron Microscopy (TEM)

  • 1. Nanofabrication
  • 2. Characterization
  • 2.1. Imaging, Surface Profiling and Geometric Characterization
  • 2.1.1. Scanning Electron Microscopy (SEM)
  • 2.1.2. Transmission Electron Microscopy (TEM)
    • Instruments
    Field emission scanning electron microscope (FEG-SEM) - Tampere University of Technology
    High Resolution Transmission Electron Microscope (JEOL JEM-2200FS with 2x Cs correctors) - Aalto University School of Science and Technology (TKK)
    Liquid Helium Cryo-Transmission Electron Microscope (JEOL JEM-3200FSC) - Aalto University School of Science and Technology (TKK)
    Transmission electron microscope - Tampere University of Technology
    Transmission electron microscope - University of Eastern Finland
    Transmission Electron Microscope (Tecnai 12 Bio Twin TEM) - Aalto University School of Science and Technology (TKK)
    Transmission Electron Microscope (TEM) - University of Jyväskylä
    Transmission Electron Microscope (TEM) - University of Jyväskylä

  • 2.1.3. Scanning Tunneling Microscopy (STM)
  • 2.1.4. Atomic Force Microscopy (AFM)
  • 2.1.5. Focused Ion Beam (FIB)
  • 2.1.6. X-ray Tomography
  • 2.1.7. Confocal Microscopy
  • 2.1.8. Surface Profilometry
  • 2.1.9. Particle Size Analysis and Counting (PCS, DLS)
  • 2.1.10. Other Imaging, Surface Profiling and Geometric Characterization
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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