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Transmission Electron Microscopy (TEM)
1. Nanofabrication
2. Characterization
2.1. Imaging, Surface Profiling and Geometric Characterization
2.1.1. Scanning Electron Microscopy (SEM)
2.1.2. Transmission Electron Microscopy (TEM)
Instruments
Energy Filtered Transmission Electron Microscope (EFTEM) - University of Oulu
Field emission scanning electron microscope (FEG-SEM) - Tampere University of Technology
Field Emission Scanning Electron Microscope (FESEM) - University of Oulu
Focused Ion Beam (FIB) System - University of Oulu
High Resolution Transmission Electron Microscope (JEOL JEM-2200FS with 2x Cs correctors) - Aalto University School of Science and Technology (TKK)
Liquid Helium Cryo-Transmission Electron Microscope (JEOL JEM-3200FSC) - Aalto University School of Science and Technology (TKK)
Transmission electron microscope - Tampere University of Technology
Transmission electron microscope - University of Eastern Finland
Transmission Electron Microscope (Tecnai 12 Bio Twin TEM) - Aalto University School of Science and Technology (TKK)
Transmission Electron Microscope (TEM) - University of Jyväskylä
Transmission Electron Microscope (TEM) - University of Jyväskylä
2.1.3. Scanning Tunneling Microscopy (STM)
2.1.4. Atomic Force Microscopy (AFM)
2.1.5. Focused Ion Beam (FIB)
2.1.6. X-ray Tomography
2.1.7. Confocal Microscopy
2.1.8. Surface Profilometry
2.1.9. Particle Size Analysis and Counting (PCS, DLS)
2.1.10. Other Imaging, Surface Profiling and Geometric Characterization
3. Computation, Modeling and Simulation
4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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