Veeco MultiMode Atomic Force Microscope
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Janne RuokolainenGSM: +358-(0)50-347 0759 email: firstname.lastname@tkk.fi
The MultiMode scanning probe microscope is the world's best-selling SPM. This versatile, high-resolution metrology and imaging tool performs a complete range of AFM techniques for surface characterization of properties like topography, elasticity, friction, adhesion, and electrical/magnetic fields. User-friendly, powerful software and a compact hardware design enable the MultiMode SPM to easily acquire data from micro- to atomic-scale images. The system's NanoScope 3D controller can scan from the maximum scan size to a few nanometers with full 16-bit resolution on all scan waveforms and on each axis. The superior performance and utility afforded by the NanoScope 3D controller has led to more publications than all other SPM controllers combined.
In addition, the MultiMode SPM's heater and cooler provide sample heating and cooling for biological applications, polymers, and other materials. The SPM has the ability to cool to -35 °C and heat to 250 °C, and scans in liquids such as water, solvents, and buffers. An environmental chamber allows purging of environment at atmospheric pressure when scanning with gases.