JEOL JSM-7500F Scanning Electron Microscope
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Janne RuokolainenGSM: +358-(0)50-347 0759 email: firstname.lastname@tkk.fi
2008
2008
The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV of any SEM available, achieving a resolution of 1.4 nm at 1 kV. The JSM-7500F provides in-lens performance (0.6nm at 30kV) but can handle samples up to 200mm in diameter x 10mm height.
The JSM-7500F is highly resistant to floor vibration and acoustic noise and is well suited for difficult installation requirements. The entirely new user interface is designed to facilitate operation for those inexperienced in FE SEM.
The JSM-7500F, with its extreme imaging capabilities, is a superior instrument for use in the fields of nanotechnology, materials science and biology.
Features
- Image Automation - allows 4 different signals to be simultaneously viewed with 16 bit imaging
- r-Filter - allows variable energy filtering of secondary electrons and backscattered electrons
- Gentle Beam mode - provides extreme images at very low accelerating voltage
- Retractable in-lens BEI detector
- 5 axis motor stage control with specimen movement protection