High Resolution Transmission Electron Microscope (JEOL JEM-2200FS with 2x Cs correctors)

Organization: Aalto University School of Science and Technology (TKK) » Faculty of Information and Natural Sciences » Department of Applied Physics » Nanomicroscopy Center

JEOL JEM-2200FS with 2x Cs correctors

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Janne Ruokolainen GSM: +358-(0)50-347 0759 email: firstname.lastname@tkk.fi http://nmc.tkk.fi

The new JEM-2200FS combines a 200kV field emission gun (FEG) and in in-column energy filter (Omega Filter) to produce a high-end, optimally configured TEM for energy filtered imagery.

The JEM-2200FS also utilizes a new, rotation-free image-forming optical system which not only facilitates acquisition of TEM images and diffraction patterns but also produces stable spectra data.

  • Built-in energy filter
  • High contrast imaging
  • Tomography
  • No darkroom required with LCD monitor
  • Extensive functions for image processing and computer analysis
  • Arrives March 2009

Nanotalo
Puumiehenkuja 2
FIN-02150 Espoo

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