Stylus Profilometer

Name and Model: Stylus Profilometer - Dektak 6M

Contact Person: Simo Torniainen
Mobile +358 40 759 3369simo.torniainen@mamk.fi

Year of Manufacture: 2006

Year of Installation: 2006

General Technical Information: Dektak 6M profilometer measures the surface topography electromechanically by moving a sample beneath a diamond-tipped stylus. As the sample stage moves, the stylus scans over the surface of the sample. The vertical movements of the stylus is measured and recorded simultaneously during the scanning, which reveals the topographical structure of the surface.

Desrcription of Use:

Key Features and Accessories: The instrument has vertical resolution in nanometers and horizontal resolution as small as twenty nanometers. Programmable stylus force and scan speed allow measurements on variety of substrate materials.


Applications:

Dektak 6M can be used to profile surface topography and waviness, as well as measuring surface roughness in the nanometer range.

Features:

* Computer controlled measurement
* Nanometers vertical resolution
* Mechanical and optical components for sample placement, viewing and scanning
* Styluses with different sizes permit measurement in a wide range of applications
* A color, high-resolution video camera for color video of a 2.6x2.6 mm area
* Convenient X-Y positioning

Key Specifications:

Photograph:

Location: Mikkeli University of Applied Sciences
Materials Technology

City: Mikkeli