Atomic Force Microscope (AFM)

Name and Model: PSIA XE-100

Contact Person: Jarkko Lievonen
jarkko.lievonen@phys.jyu.fi

Year of Manufacture: 2005

Year of Installation: 2005

General Technical Information: Atomic Force Microscope (AFM)

Desrcription of Use: Imaging in tapping mode

Key Features and Accessories: Non-contact mode AFM
Contact mode AFM
Tapping mode AFM
Lateral Force Microscopy (LFM)
Force vs distance Curve
Environmental chamber, which allows control of humidity and pressure. Also imaging in different gases is possible.
Calibrated x, y and z scales
Separated xy and z scanners to eliminate crosstalk and non-linearity
Active vibration isolation

Key Specifications: Sample size: up to 100 mm x 100 mm x 20 mm
Sample mass: 500 g
X-Y scan size: 100 µm x 100 µm
Z measurement range: 12 µm

Photograph:

Location: University of Jyväskylä, Nanoscience Center
Survontie 9, 40500 Jyväskylä

City: Jyväskylä