Atomic Force Microscope (AFM)

Name and Model: Digital Instruments, Dimension 3100 (Nanoscope IV), Veeco

Contact Person: Antti Nuottajärvi
nuanka@jyu.fi +358503956002

Year of Manufacture: 2003

Year of Installation: 2003

General Technical Information:

Atomic Force Microscope

Measurements in liquids

Desrcription of Use: Tapping mode imaging
Contact mode imaging
Lateral force measurements
Nanomanipulation

Key Features and Accessories: Contact mode AFM
Tapping mode AFM
Phase Imaging
Nanoindenting / Scratching
Lateral Force Microscopy (LFM)
Force vs distance Curve
Liquid Cell
Closed loop scanner
Calibrated x, y and z scales

Key Specifications: Sample size: up to 200mm in diameter
X-Y scan size: 90 µm x 90 µm
Z measurement range: 6 µm

Photograph:

Location: University of Jyväskylä, Nanoscience Center
Survontie 9, 40500 Jyväskylä

City: Jyväskylä