Scanning Electron Microscope (SEM)

Name and Model: Zeiss EVO-50XVP

Contact Person: Hannu Pakkanen
hapakka@jyu.fi

Year of Manufacture: 2006

Year of Installation: 2006

General Technical Information:

Scanning electron microscope Zeiss EVO-50 XVP, LaB6 emitter.

Desrcription of Use: Wood and plant based fiber samples, process precipitates and metal powder samples

Key Features and Accessories:

Detectors

SE (secondary electron detector, Everhart-Thornley type)

VPSE (Variable Pressure Secondary Electron) for XVP® mode

Lens mounted BSE (Backscattered Electron) detector

and

Energy Dispersive X- ray Spectrometer Bruker AXS XFlash® Detector 3001for elemental analysis

                        LN2-free (Peltier cooled) high-speed SDD Detector

                        Detection of Carbon and up

Energy resolution < 133 eV (MnKa, 1000 cps)

Key Specifications: Resolution 3.0 nm (SE) in high vacuum mode

Photograph:

Location: University of Jyväskylä, Nanoscience Center
Survontie 9, 40500 Jyväskylä

City: Jyväskylä