Optical 3D profilometer

Organization: Mikpolis Oy

Name and Model: Optical 3D profilometer FRT-Microprof

Contact Person: Aapo Nylén
Mobile: + 358 40 534 5127email: aapo.nylen@mamk.fi

Year of Manufacture: 2006

Year of Installation: 2006

General Technical Information: The MicroProf works as an optical profilometer (2D) as well as an imaging measuring instrument (3D) by means of a scanning process. Roughness and waviness can be determined in 2D or 3D according to DIN EN ISO standards. With the optical sensor FRT CWL, the sample is illuminated by focused white light. Evaluating the reflected light, the sensor investigates the structures on the sample at a working distance of 4 mm.

Desrcription of Use:

Key Features and Accessories:

Key Specifications:

Measuring range	Accuracy zlocal	Measuring resolution
Measuring range	Accuracy zlocal	z-direction	xy-direction
300 µm	± 100 nm	~10 nm	~2 µm
600 µm	± 200 nm	~20 nm	~2 µm
3 mm	± 1 µm	~100 nm	~6 µm
Coating thickness: measuring range 2-200 µm	± 100 nm	~10 nm	~30 µm

Photograph:

Location: Mikkeli University of Applied Sciences / Material technology

City: Mikkeli

Optical 3D profilometer

Organization: Mikpolis Oy

Delete instrument