Name and Model: Nanosurf easyScan 2
Contact Person: Nikolai Chekurov
Year of Manufacture: 2008
Year of Installation: 2008
General Technical Information: Portable atomic frce microscope (AFM) for educational use
Desrcription of Use: Teaching, demonstrations
Key Features and Accessories: Contact mode atomic force microscope (AFM), portable
Key Specifications:
Scan range 70x70 µm
Max. z-range 14 µm
z-resolution 0,21 nm
xy-resolution 1,1 nm
z-noise level (RMS static/dynamic) 0,6 nm/0,5 nm
Photograph:
Location: Micronova Nanofabrication Centre. Tietotie 3, 02150 Espoo
City: Espoo
Additional information:
Booking:
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