Stylus instrument

Organization: MIKES Centre for Metrology

Form Talysurf series 2

Björn Hemming
bjorn.hemming@mikes.fi 010-6054403

2D and 3D form measurements

Surface roughness measurements (R3y, R3z, Ra, Rc, Rda, Rdc, Rdq, RHSC, Rku, Rln, RLo, Rlq, Rmr, Rmr(c), Rp, RPc, Rq, RS, Rsk, RSm, Rt , Rv, RVo, Rz, Rz(JIS))

Surface roughness measurements are based on standards ISO 5436-1 and ISO 4287

 

Measurement tips:     radius 2 µm (diamond tip)
                                       radius 0.397 mm (sapphire tip)

Measurement force:  1 mN (diamond tip) or 15-20 mN (sapphire tip)

Measurement range: 120 mm x 50 mm x 28 mm (x,y,z)

Resolution:                   0.6 nm (in z direction)


Uncertainty down to 10 nm (depends on the sample dimensions)

Uncertainty in surface roughness measurements 10 %

Mittatekniikan keskus (MIKES)
Tekniikantie 1
02151 Espoo

Espoo

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