Spectroscopic Ellipsometer

Name and Model: Sentech SE 805

Contact Person: Markus Bosund

Year of Manufacture:

Year of Installation: 2006

General Technical Information:

Spectroscopic ellipsometer for the wavelength range 700-1700 nm

Desrcription of Use:

Used for measuring thickness and optical properties (reactive index and extinction coefficent) of thin films.

Key Features and Accessories:

Wavelength range 700-1700 nm. Adjustable angle of incidence. Fitting software.

Key Specifications:

Photograph:

Location: Micronova Nanofabrication Centre - room 1152. Tietotie 3, 02150 Espoo

City: Espoo