Name and Model: PANalytical X’Pert Pro MPD
Contact Person: Mikko Heikkilä
Year of Manufacture: 2007
Year of Installation: 2007
General Technical Information: X-ray diffractometer
Desrcription of Use: X-ray diffraction (XRD) is used for phase identification of crystalline materials, X-ray reflectometry (XRR) is used for determination of thickness, roughness and density of thin films. High temperature XRD and XRR in different atmospheres.
Key Features and Accessories: Theta-theta goniometer with several sample stages, including oven for high temperature measurements. Fast and easy exchange between parafocusing and parallel beam geometries. PIXcel detector for very high dynamic range.
Key Specifications: For parafocusing geometry, the diffractometer is equipped with programmable divergence slit on incident beam and programmable antiscatter slit on diffracted beam side. For parallel beam there is a multilayer x-ray mirror on incident beam side and parallel beam collimator on diffracted side. Soller slits on both sides on both geometries. PIXcel detector is used for both geometries including reflectometry. Anton-Paar HTK1200N oven is used for high temperature measurements. Atmospheres available include currently air, O2, N2 and forming gas (5 % H2 / 95 % N2). Both powder and solid samples can be measured in oven.
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Location: University of Helsinki, Department of Chemistry, Laboratory of Inorganic Chemistry, room C327
City: Helsinki
Additional information: Against time fee only if the person has been trained for measuring alone by contant person.
Booking: ”As a service” measurements are to be arranged with the contact person.
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