Energy dispersive X-ray microanalysis system (EDX)

Name and Model: Oxford INCA 350 Energy

Contact Person: Marianna Kemell

Year of Manufacture: 2005

Year of Installation: 2005

General Technical Information: Energy dispersive X-ray microanalysis system connected with a scanning electron microscope (SEM-EDX).

Desrcription of Use: Qualitative and quantitative EDS analysis, including point measurements, linescans and elemental mapping.

Key Features and Accessories: Basic analysis (qualitative and quantitative); Point&ID analysis from individually selected multiple points and regions (qualitative and quantitative); Elemental mapping and linescans (qualitative only). Compensation for sample drift during analysis. Elements heavier than and including beryllium detectable. Standards database. XPP matrix correction scheme. Other options: Spectrum simulation for user-defined composition and measurement parameters; Standardization; Automatic unattended measurements.

Key Specifications:

X-ray detector: X-sight Si(Li) Premium with 10mm2 SATW Window

Energy resolution (hardware): 132 eV

Peak resolution stability: <1eV at Mn Kα between 1,000 and 10,000cps                

Photograph:

Location: University of Helsinki, Department of Chemistry, A.I.Virtasen aukio 1, 00560 Helsinki

City: Helsinki