Name and Model: Park Systems XE-100
Contact Person: Ari Halvari mikko.laasanen@savonia.fi+358 44 785 5591
Year of Manufacture: 2005
Year of Installation: 2005
General Technical Information: Atomic force microscope + nanoindentation, electrical conductivity, nanomanipulation and nanolithography options.
Desrcription of Use: Surface topography analyses. Nanoindentation, conductivity measurements.
Key Features and Accessories: Closed loop scanners. Separate Z-scanner piezo. Special knowledge for imaging biological and pharmaceutical samples. Options: Nanoindentation, electrical conductivity measurements, nanomanipulation&lithography. Custom made calibration analyses software for nanoindentation (LabVIEW). Spring constant calibration (Sader's method) and tip shape calibration with reference materials.
Key Specifications: Imaging area (XY): 50 x 50 micrometersMaximum height variation: 12 micrometersMaximum sample size: 2x100x100 mm (500 g)Z-scanner resolution: 0.05 nmTypical non contact tips: NCHR, <10 nm tip radius, 42 N/m (Micromasch).Nanoindentation: For samples with Young’s modulus < 50 GPa. Nanoindentation silicon tips: 10nm/42N/m, 10nm/0.6N/m, 50nm/0.05N/m. Diamond tip:192 N/m.
Photograph:
Location: Savonia University of Applied Sciences, School of Engineering and Technology, Microkatu 1C, FI-70201 Kuopio, Finland
City: Kuopio
Additional information: Available only as a service for short term use. With long term needs call the contact person for more information.
Booking: In case of "as a service", please, call contact person.
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