Scanning electron microscope

Name and Model: Philips XL30 ESEM TMP

Contact Person: Arto Koistinen

Year of Manufacture:

Year of Installation: 2000

General Technical Information:

Desrcription of Use: XL30 ESEM-TMP environmental scanning electron microscope is applicable for the examination of both dry and water containing specimens with good resolution (3.5 nm). Specimens can also be analysed with EDS -analyser that makes the element analysis of the sample possible.

Key Features and Accessories:

High vacuum mode

"Low vacuum" mode

ESEM mode

Embedded Röntec EDS analyser

Key Specifications:

Gun: Tungsten gun 

Accelerating voltage: 0.2-30 kV

Resolution at 30 kV: 3.5 nm in high vacuum mode and in 5 Torr ESEM mode. 25 nm in 1 kV in high vacuum mode.

Magnification: 5x to 400,000x

Specimen movements: X=50 mm, Y=50 mm, rotation=360° continuous, tilt range -15° to +75°, 0 to +45° for large specimens, Z movement 50 mm total, max free space=60 mm.

Sample chamber: inside diameter 284 mm

Photograph:

Location: BioMater Centre

City: Kuopio