Name and Model: Jeol JSM-6400
Contact Person: N/A
Year of Manufacture:
Year of Installation:
General Technical Information:
Desrcription of Use: Electron microscope imaging and elemental and structural analysis of materials.
Key Features and Accessories:
Microscope equipped with EDS (Energy-Dispersive X-ray Spectroscopy) analyzer and EBSD (Electro Backscatter Diffraction) camera for chemical and crystal structure analysis.
Key Specifications: Acceleration voltage: 1-40 kVResolution: 3.5 nm/35 kVEDS detectorElemental analysis from carbon to uraniumEBSD camera and analysis software for crystal structure analysis
Photograph:
Location: University of Oulu, Center of Microscopy and Nanotechnology
City: Oulu
Additional information:
Booking:
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