Field Emission Scanning Electron Microscope (FESEM)

Name and Model: Zeiss ULTRA plus

Contact Person: N/A

Year of Manufacture: 2008

Year of Installation: 2008

General Technical Information: Field emission scanning electron microscope (FESEM) enables high resolution electron imaging with low acceleration voltages which makes it possible to analyze also delicate biological samples and nanostructures.

Desrcription of Use: High-resolution electron microscope imaging and elemental and structural analysis of materials. Also biological samples can be studied

Key Features and Accessories: Microscope is equipped with STEM (Scanning Transmission Electron Microscope) detector, so it can also be used in transmission electron microscope imaging of thin samples. For chemical and structural analysis microscope is equipped with EDS (Energy-Dispersive X-ray Spectroscopy) analyzer and EBSD (Electro Backscatter Diffraction) camera.

Key Specifications: Acceleration voltage: 0.02-30 kV
Resolution: 1.0 nm/15 kV, 1.7 nm/ 1 kV, 4.0 nm/0.1 kV
Detectors: two SE, two BSE, one STEM
EDS detector
Elemental analysis from carbon to uranium
EBSD camera and analysis software for crystal structure analysis
Flood gun for charge compensation

Photograph:

Location: University of Oulu, Center of Microscopy and Nanotechnology

City: Oulu