Name and Model: Jeol JXA-8200 EPMA
Contact Person: N/A
Year of Manufacture: 2006
Year of Installation: 2006
General Technical Information:
Desrcription of Use: Electron probe microanalyzer (EPMA) is used for the analysis of the chemical composition of the samples.
Key Features and Accessories: EPMA can detect very small element concentrations at the level as low as 100 ppm. Microanalyzer can be used for example to produce element distribution maps from the surface of the samples.
Key Specifications: Filament: LaB6Five wavelength dispersive x-ray spectrometer (WDS)EDS (Energy-Dispersive X-ray Spectroscopy) detectorElemental analysis from beryllium to uraniumSmallest detectable element concentration: 100 ppm
Photograph:
Location: University of Oulu, Center of Microscopy and Nanotechnology
City: Oulu
Additional information:
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