Atomic Force Microscope

Name and Model: ThermoMicroscopes Explorer 4400-11 with Micro-Thermal Analysis fasilities

Contact Person: Mika Suvanto

Year of Manufacture: 2001

Year of Installation: 2001

General Technical Information: Atomic force microscope

Desrcription of Use: Surface characterization; topography, stiffness, adhesion and thermal conductivity imaging

Key Features and Accessories:

contact and non-contact modes:surface topography

pulsed force mode:stiffness, adhesion and topography

scanning thermal microscopy: thermal conductivity imaging

Key Specifications:

100 micrometer dry and liquid scanners: X-Y 100 micrometer, Z 8 micrometer

2 micrometer dry scanner: X-Y 2 micrometer and Z 0.2 micrometer

Photograph:

Location: University of Eastern Finland, Joensuu Campus, Department of Chemistry

City: Joensuu