Field emission scanning electron microscope, FE-SEM

Name and Model: Hitachi S-4800 FE-SEM

Contact Person: Mika Suvanto

Year of Manufacture: 2005

Year of Installation: 2005

General Technical Information: High-resolution field emission scanning electron microscope

Desrcription of Use: High resolutin SEM and STEM imaging and X-ray microanalysis

Key Features and Accessories: Detectors: upper and lower secondary electron detectors, equipped with an energy filter, YAG detector, STEM detector (brigh / dark field), EDS detector

Key Specifications:

Acceleration voltage: 0,5-30 kV

Resolution: 1.0 nm at 15 kV, 2.0 nm at 1 kV

Magnification: 20-800 000x

Stage: X-Y 0-50 mm, Z 1.5-40 mm, tilt: -5 - +70°, rotation: 360°

Photograph:

Location: University of Eastern Finland, Joensuu campus, Department of Chemistry

City: Joensuu