Energy dispersive X-ray analysis, EDS

Name and Model: NORAN System SIX Microanalysis system connected to Hitachi S-4800 FE-SEM

Year of Manufacture: 2006

Year of Installation: 2006

General Technical Information: NORAN system SIX -EDS detector connected to High-resolution field emission scanning electron microscope

Desrcription of Use: X-ray ananlysis and spectral imaging

Key Features and Accessories:

Analytical software: Z-ray spectra, X-ray maps and digital images

(Spectral imaging, Point & shoot, X-ray mapping, Linescan acquisition, Size, shape and chemical typing analysis of features in an electron image)

Key Specifications:

Photograph:

Location: University of Eastern Finland, Joensuu campus, Department of Chemistry

City: Joensuu