Scanning probe microscope

Organization: Åbo Akademi University » Center of Excellence for Functional Materials (FUNMAT)

Multimode V (Nanoscope V) N-TEGRA Prima

Petri Ihalainen
  pihalain@abo.fi                 http://web.abo.fi/fak/tkf/pap/

Multimode V: 2009 N-Tegra Prima: 2006

                     N-TEGRA Prima:                        Multimode V:

max sample size:                      2x3.5 cm2                                1.5 x 1.5 cm2

max sample thickness:             2.0 cm (unlimited)                      0.5 cm

measurement media:                gas and liquid (limited)               gas and liquid

max sampling area:                 125 x 125 µm2                          100 x 100 µm2

max z-range:                           6 µm                                         5 µm

max pixel resolution:               1024 x 1024                             5120 x 5120

feedback:                               closed or open-loop                  open-loop       

surface characterization

 

harmonic probe holder, high-temperature scanner, acoustic expansion module, scanning near-field optical expansion module, electrostatic and magnetic force microscopy probe holder, force modulation probe holder, liquid and gas cells, atmospheric hood (RH and T)

Currently available operation modes (both in microscopy and spectroscopy):

topographic imaging, phase imaging, lateral (friction) force microscopy, high temperature imaging, thermal spectroscopy, force modulation spectroscopy, magnetic force microscopy, atomic force acoustic microscopy, electrostatic force microscopy, scanning near-field optical microscopy, force-distance measurements, surface potential imaging, harmonic imaging

Multimode V: fysikaalisen kemian laitos, ÅA
N-Tegra: paperinjalostuksen laboratorio, ÅA

Turku / Åbo

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