Transmission electron microscope

Name and Model: Transmission electron microscope Jeol JEM 2010

Contact Person: Minnamari Vippola
+358 40 849 0148, www.tut.fi/matchar

Year of Manufacture:

Year of Installation:

General Technical Information:

Transmission electron microscope (TEM) equipped with an energy dispersive X-ray spectrometer (EDS), a scanning unit (STEM) and a digital camera system.

Desrcription of Use:

The microscope is used primarily for studying the structure and chemistry of materials at high spatial resolution.

Key Features and Accessories:

• LaB₆ electron source
• Accelerating voltage 80-200kV
• Point resolution 0.23 nm
• ± 30° of eucentric specimen tilt
• Noran Vantage, Energy Dispersive X-ray spectrometer (EDS) with Si(Li) detector
• Gatan 7megapixel CCD camera system, ORIUS SC600.

Key Specifications:

Photograph:

Location: Tampere University of Technology, Department of Materials Science, Korkeakoulunkatu 6, 33720 Tampere

City: Tampere