Field emission scanning electron microscope (FEG-SEM)

Name and Model: Carl Zeiss NTS GmbH, Scanning Electron Microscope ULTRAplus

Contact Person: Kati Rissa
+358 40 849 0142

Year of Manufacture: 2007

Year of Installation: 2008

General Technical Information: Ultra high resolution field emission SEM with EDS and EBSD

Desrcription of Use: Characterization of various materials. Suitable for transmission electron microscopy studies of polymers (STEM-detector).

Key Features and Accessories: Detectors: inlens SE, EsB, AsB, Everhart-Thornley, and STEM

Charge compensator for non-conductive samples

SIS Scandium image analysis and processing software

INCA Energy 350 EDS analyzator with INCAx-act peltier cooled analytical drift detector (ADD)

• Resolution 133 eV/10 mm²
• Stable analytical results with count rate up to 40000 cps and fast X-ray mapping

HKL Premium-F Channel EBSD system with ultrafast Nordlys F400 detector

• Mapping, advanced texture analysis and phase ID with forescatter detector
• Indexing hit rate at 400 Hz: 99%

Key Specifications:

• Resolution 1.0 nm at 15 kV and 1.7 nm at 1 kV
• Accelerating voltage 100 V - 30 kV
• Beam current up to 40 nA
• Active antivibration system AVI-400

Photograph:

Location: Tampere University of Technology, Department of Materials Science, Korkeakoulunkatu 6, 33720 Tampere

City: Tampere