Atomic Force Microscope (AFM)

Name and Model: Veeco Dimension 3100

Contact Person: Jukka Viheriälä

Year of Manufacture: 2005

Year of Installation: 2006

General Technical Information: Nanoscale-resolution scanning probe microscope capable of topographic and electrical measurements of surfaces.

Desrcription of Use: Topographic and electrical measurements of surfaces.

Key Features and Accessories: Measurement modes: Contact mode, tapping mode, friction measurements, force measurements, electromagnetic force measurements (EFM), Current-AFM (CAFM)

Key Specifications:

Max. sample size: 150mm

Max. sample height : 12mm

Max. scanning ranges X-Y: ~ 90um, vertical: ~6um.

Scan accuracy, relative error: x-y -direction: ~2%, z-direction: <1%

Typical radius of curvature of the scanning tip is <10nm. Tips with radius of curvature on the order of 2nm are also available.

Photograph:

Location: ORC
Tampere University of Technology
P.O. Box 692
FIN-33101 Tampere
Finland

Street address:
Korkeakoulunkatu 3
33720 Tampere
Finland

Telephone:
+358 3 3115 2910
Fax:
+358 3 3115 3400

City: Tampere